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Electrons and ions allow imaging, chemical and structural analysis at sub-nanometer scale in many materials of interest to physical and biological sciences. The practical limits can arise from the instrumentation, the interactions responsible for the measured signal and, ultimately, by radiation damage inflicted on the studied sample by the incident beam. Presentations in this year’s symposium discuss the practical aspects of pushing the boundaries of electron and ion microscopy instrumentation, and the practical problems applying the electron and ion beam analysis to real-world samples in physical and biological sciences.
