A joint symposium to promote interaction between Microscopical Society of Canada (MSC) and Japanese Society of Microscopy (JSM) will take place at the Osaka meeting of the JSM from May 25 to 27, 2020. Kindly consider participating in the symposium.
The common theme limiting electron microscopy is radiation damage. Therefore, the focus of the symposium is the means for overcoming the electron damage limitations in conventional and environmental electron microscopy, spectroscopy, interferometry and preparation of samples affected by radiation damage. Contributions on applications of microscopy to radiation sensitive samples and data processing methods applicable to such samples are also welcome.
Students and postdoctoral fellows are encouraged to apply for CFDM award, decribed below.
Abstract submission will be open from Jan 10, 2020 to Feb 13, 2020. Should you be interested in participating please let us know by email to ms.sm.canada+JSM@gmail.combefore Jan 27, 2020. The abstract templates available here. Additional information can be found here or by email to: Marek Malac.
Shigeo Mori, Ken Harada, Marek Malac and Misa Hayashida, symposium organizers.
